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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11175141 B1

PDFFull Text
Date of Patent:
Nov. 16, 2021

Filed:

Jun. 23, 2015

Checking map alignment

Applicant:

Here Global B.v., Eindhoven, NL;

Inventors:

Muhammad Irshan Khan, Tampere, FI;

Jari Syrjärinne, Tampere, FI;

Lauri Wirola, Tampere, FI;

Pavel Ivanov, Tampere, FI;

Assignee:

HERE GLOBAL B.V., Eindhoven, NL;

Attorney:

Alston & Bird LLP

Primary Examiner:

Abby Y Lin

Assistant Examiner:

Renee LaRose

Int. Cl.
CPC ...
G01C 21/00 (2006.01); G01C 21/20 (2006.01); G06F 16/29 (2019.01); G09B 29/00 (2006.01); G09B 29/10 (2006.01);
U.S. Cl.
CPC ...
G01C 21/005 (2013.01); G01C 21/206 (2013.01); G06F 16/29 (2019.01); G09B 29/00 (2013.01); G09B 29/106 (2013.01);
Abstract

A method, performed by an apparatus ()(), is disclosed, the method comprising: obtaining alignment information pertaining to a map (), which is or is to be aligned in a reference frame; performing or receiving a result of a check of the alignment of the map () at least based on the obtained alignment information and on reference information allowing for an at least partial check of the alignment of the map () in the reference frame.

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Khan, Muhammad. (2021). Checking map alignment (U.S. Patent No. 11175141). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11175141

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