The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2021
Filed:
Dec. 05, 2019
Leica Geosystems Ag, Heerbrugg, CH;
Stefan Martin Benjamin Gächter Toya, St. Gallen, CH;
Norbert Kotzur, Altstätten, CH;
LEICA GEOSYSTEMS AG, Heerbrugg, CH;
Abstract
A measuring system comprising a measuring instrument and a computer system, the measuring instrument comprising a base unit, a support unit mounted on the base unit, a targeting unit comprising a distance meter having a targeting axis, a first angle encoder configured for measuring a horizontal angular position of the support unit, a second angle encoder for measuring a vertical angular position of the targeting unit, a camera for capturing image data, and a control unit is configured for computing a position of a target based on a preconfigured target attribute, the computer system being configured for receiving the image data from the camera, executing a classifier for determining at least one of a plurality of classes of at least part of the image data, validating a preconfigured target attribute based on the at least one class target attribute, and generating result data based on the validation.