The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2021

Filed:

Feb. 27, 2012
Applicants:

James F. Greenleaf, Rochester, MN (US);

Shigao Chen, Rochester, MN (US);

Armando Manduca, Rochester, MN (US);

Pengfei Song, Rochester, MN (US);

Inventors:

James F. Greenleaf, Rochester, MN (US);

Shigao Chen, Rochester, MN (US);

Armando Manduca, Rochester, MN (US);

Pengfei Song, Rochester, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/08 (2006.01); G01N 29/07 (2006.01); G01N 21/17 (2006.01); G01N 29/24 (2006.01); G01N 29/22 (2006.01); G01S 7/52 (2006.01); A61B 5/00 (2006.01); G01R 33/48 (2006.01); G01S 15/89 (2006.01); A61B 8/00 (2006.01);
U.S. Cl.
CPC ...
A61B 8/485 (2013.01); A61B 5/0059 (2013.01); A61B 8/5223 (2013.01); G01N 21/17 (2013.01); G01N 29/075 (2013.01); G01N 29/221 (2013.01); G01N 29/2456 (2013.01); G01R 33/4814 (2013.01); G01S 7/52042 (2013.01); A61B 8/461 (2013.01); G01N 2291/02475 (2013.01); G01N 2291/02827 (2013.01); G01N 2291/0422 (2013.01); G01S 15/8927 (2013.01);
Abstract

Methods for measuring mechanical properties of an object or subject under examination with an ultrasound system and using unfocused ultrasound energy are provided. Shear waves that propagate in the object or subject are produced by applying unfocused ultrasound energy to the object or subject, and measurement data is acquired by applying focused or unfocused ultrasound energy to at least one location in the object or subject at which shear waves are present Mechanical properties are then calculated from the acquired measurement data.


Find Patent Forward Citations

Loading…