The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2021

Filed:

Jul. 24, 2019
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Christoph Forman, Erlangen, DE;

Andreas Greiser, Erlangen, DE;

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/055 (2006.01); G01R 33/56 (2006.01); G06T 7/00 (2017.01); G06T 7/10 (2017.01); G01R 33/561 (2006.01); A61B 5/00 (2006.01); G01R 33/565 (2006.01);
U.S. Cl.
CPC ...
A61B 5/055 (2013.01); G01R 33/5608 (2013.01); G06T 7/0012 (2013.01); A61B 5/742 (2013.01); G01R 33/561 (2013.01); G01R 33/565 (2013.01); G06T 7/10 (2017.01); G06T 2207/10088 (2013.01);
Abstract

In a method for analyzing acquired magnetic resonance images, an image series is provided that includes acquired magnetic resonance images of a slice of an object, picture elements of the acquired magnetic resonance images of the image series are fitted to generate a parameter map and an error map, the acquired magnetic resonance images are automatically segmented to generate image segments, histograms of the parameter map and the error map are generated based on the image segments, and the histograms are analyzed to generate an output of analysis results and/or generate a visualization including the parameter map, the error map, and the image segments. The acquired magnetic resonance images can have a variation of a contrast-determining acquisition parameter.


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