The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2021
Filed:
Apr. 08, 2019
Waymo Llc, Mountain View, CA (US);
Chen David Lu, Campbell, CA (US);
Matthew Rinehart, San Mateo, CA (US);
Volker Grabe, Redwood City, CA (US);
Waymo LLC, Mountain View, CA (US);
Abstract
Example embodiments relate to identifying defects in optical detector systems based on extent of stray light. An example embodiment includes a method. The method includes capturing, using an optical detector system, an image of a scene that includes a bright object. The method also includes determining a location of the bright object within the image. Further, the method includes determining, based on the location of the bright object within the image, an extent of stray light from the bright object that is represented in the image. In addition, the method includes determining, by comparing the extent of stray light from the bright object that is represented in the image to a predetermined threshold extent of stray light, whether one or more defects are present within the optical detector system. The predetermined threshold extent of stray light corresponds to an expected extent of stray light.