The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2021
Filed:
Nov. 14, 2019
Method and apparatus for predicting experience degradation events in microservice-based applications
Intuit Inc., Mountain View, CA (US);
Shreeshankar Chatterjee, Mountain View, CA (US);
INTUIT, INC., Mountain View, CA (US);
Abstract
Techniques are disclosed to predict experience degradation in a microservice-based application comprising a plurality of microservices. Quality of service metrics are derived for each node from the historical event log data of nodes forming a plurality of directed acyclic graph (DAG) paths in the multiple-layer nodes. A clustering model clusters the plurality of quality of service metrics according to multiple levels of quality of experience and determines respective value ranges of each quality of service metric for the multiple levels of quality of experience. Each quality of service metric is labeled with one of the multiple levels of quality of service according to the respective value ranges. A support vector machine model predicts various experience degradation events which are expected to occur during the operation of the microservice-based application.