The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2021

Filed:

May. 06, 2020
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Chulmin Jung, San Diego, CA (US);

Bin Liang, San Diego, CA (US);

Chi-Jui Chen, San Diego, CA (US);

Assignee:

Qualcomm Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 29/02 (2006.01); G11C 29/20 (2006.01); G11C 29/12 (2006.01); G11C 29/44 (2006.01); G11C 29/10 (2006.01);
U.S. Cl.
CPC ...
G11C 29/022 (2013.01); G11C 29/10 (2013.01); G11C 29/12015 (2013.01); G11C 29/20 (2013.01); G11C 29/44 (2013.01); G11C 29/787 (2013.01);
Abstract

A method for a memory subsystem redundancy with priority decoding is described. The method includes dynamically repairing a local input/output (IO) unit of a first memory subsystem bank based on a current redundancy fuse input pattern of the first memory subsystem bank. The method also includes concurrently generating a redundancy shift signal in each global IO based on the current redundancy fuse input pattern to shift the repaired local IO unit and lower order local IO units of the first memory subsystem bank relative to the repaired local IO unit.


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