The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2021
Filed:
Jun. 07, 2017
Hitachi, Ltd., Tokyo, JP;
Hiroshige Kashiwabara, Tokyo, JP;
Takuma Nishimura, Tokyo, JP;
Yoshimi Fujimata, Tokyo, JP;
Hidemasa Nakai, Tokyo, JP;
Jumpei Honda, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A reading device includes wireless slave devices that communicate via a multihop wireless network, a measuring unit that measures the state of an inspection target to generate measurement data, a measurement data analysis unit, and a failure cause analysis unit that analyzes a failure cause when the analysis of the failure cause analysis unit fails. The reading device transmits the measurement data to the data collecting device by associating the measurement data with failure cause information. The data collecting device includes a wireless master device, a measurement data acquisition unit that acquires measurement data from each reading device, a recording unit that records the measurement data when the measurement data is not associated with failure cause information, and a retry control unit that retries data acquisition according to the type of the failure cause when the measurement data is associated with the failure cause information.