The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2021

Filed:

Jun. 21, 2018
Applicant:

Technion Research & Development Foundation Limited, Haifa, IL;

Inventors:

Ben Ezair, Haifa, IL;

Gershon Elber, Haifa, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 17/10 (2006.01); G06T 17/30 (2006.01); B29C 64/393 (2017.01); G05B 19/4099 (2006.01); G06T 19/20 (2011.01); B33Y 10/00 (2015.01); B33Y 50/02 (2015.01);
U.S. Cl.
CPC ...
G06T 17/10 (2013.01); B29C 64/393 (2017.08); G05B 19/4099 (2013.01); G06T 17/30 (2013.01); G06T 19/20 (2013.01); B33Y 10/00 (2014.12); B33Y 50/02 (2014.12); G05B 2219/49008 (2013.01); G06T 2219/2024 (2013.01);
Abstract

There is provided a method of generating instructions for manufacturing of a functionally graded material (FGM) object, comprising: providing geometric trivariate(s) defining geometry of FGM object, providing material trivariate(s) defining material properties of the FGM object, computing a volumetric representation of the FGM object that includes the geometric trivariate(s) and the material trivariate(s) spanning a same parametric domain, and computing code instructions for execution by a manufacturing device controller of a manufacturing device for manufacturing of the FGM object by: identifying locations within the boundaries defined by the geometric trivariate(s) of the volumetric representation, computing respective material value(s) for each of the locations according to the material trivariate(s) of the volumetric representation corresponding to the identified locations, and converting the locations from the parametric domain to the Euclidean space, wherein each of the locations in Euclidean space is associated with the respective material value(s).


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