The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2021
Filed:
Mar. 06, 2020
Applicant:
General Electric Company, Schenectady, NY (US);
Inventor:
Clark Alexander Bendall, Skaneateles, NY (US);
Assignee:
BAKER HUGHES, A GE COMPANY, LLC, Houston, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/50 (2017.01); G06T 19/00 (2011.01); G06F 3/00 (2006.01); G01B 11/24 (2006.01); G06T 7/00 (2017.01); G06T 7/62 (2017.01); G06F 3/0484 (2013.01);
U.S. Cl.
CPC ...
G06T 7/50 (2017.01); G01B 11/24 (2013.01); G06F 3/005 (2013.01); G06F 3/04845 (2013.01); G06T 7/0004 (2013.01); G06T 7/62 (2017.01); G06T 19/00 (2013.01); G06T 2200/04 (2013.01); G06T 2200/24 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/10068 (2013.01); G06T 2207/20101 (2013.01); G06T 2207/30136 (2013.01); G06T 2207/30164 (2013.01); G06T 2210/41 (2013.01); G06T 2219/012 (2013.01); G06T 2219/028 (2013.01);
Abstract
A method and device for measuring dimensions of a feature on or near an object using a video inspection device. A reference surface is determined based on reference surface points on the surface of the object. One or more measurement cursors are placed on measurement pixels of an image of the object. Projected reference surface points associated with the measurement pixels on the reference surface are determined. The dimensions of the feature can be determined using the three-dimensional coordinates of at least one of the projected reference surface points.