The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2021
Filed:
Jun. 10, 2019
Applicant:
Vibe Imaging Analytics Ltd., Bnei-Brak, IL;
Inventor:
Ron Hadar, Capitola, CA (US);
Assignee:
Vibe Imaging Analytics Ltd., Bnei-Brak, IL;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/62 (2017.01); H04W 4/029 (2018.01); A01D 45/30 (2006.01); A01D 75/02 (2006.01); A01D 41/127 (2006.01); G06Q 30/00 (2012.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); A01D 45/30 (2013.01); A01D 75/02 (2013.01); G06Q 30/018 (2013.01); G06T 7/0004 (2013.01); G06T 7/62 (2017.01); H04W 4/029 (2018.02); A01D 41/127 (2013.01); A01D 41/1277 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/30128 (2013.01); G06T 2207/30242 (2013.01);
Abstract
A system and method for automated grain inspection and analysis of results during harvest, using an inspection system mounted on a combine harvester with geolocation tracking, allowing for real time analysis during harvest and tracking of grain quality by location of harvest.