The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2021

Filed:

Oct. 29, 2018
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Hikaru Koyama, Tokyo, JP;

Toshio Okochi, Tokyo, JP;

Toshihiro Kujirai, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 10/06 (2012.01); G05B 19/418 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G06Q 10/06393 (2013.01); G05B 19/4183 (2013.01); G05B 23/0224 (2013.01); G06Q 10/0637 (2013.01); G06Q 10/06395 (2013.01);
Abstract

A data analysis apparatus generates M (M is an integer of 3 or greater) groups each including data regarding a plurality of units from data where first KPIs and K (K is an integer of 2 or greater) explanatory variables are given by 1:1, generates a second KPI indicating the state of the group based on the values of a plurality of first KPIs included in the group, and selects a feature for the first KPIs based on a correlation analysis between the second KPI of each group and the feature of each group calculated based on the explanatory variables.


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