The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2021
Filed:
Feb. 17, 2017
Microsoft Technology Licensing, Llc, Redmond, WA (US);
Nathan Wiebe, Redmond, WA (US);
Ilia Zintchenko, Zurich, CH;
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
Methods and apparatus are provided that permit estimation of eigenphase or eigenvalue gaps in which random or pseudo-random unitaries are applied to a selected initial quantum state to produce a random quantum state. A target unitary is then applied to the random quantum state one or more times, or an evolution time is allowed to elapse after application of the target unitary. An inverse of the pseudo-random unitary used to produce the random quantum state is applied, and the resultant state is measured with respect to the initial quantum state. Measured values are used to produce Bayesian updates, and eigenvalue/eigenvector gaps are estimated. In some examples, the disclosed methods are used in amplitude estimate and control map determinations. Eigenvalue gaps for time-dependent Hamiltonians can be evaluated by adiabatic evolution of the Hamiltonian from an initial Hamiltonian to a final Hamiltonian.