The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2021

Filed:

Sep. 19, 2017
Applicant:

Tidyware, Llc, Bellevue, WA (US);

Inventors:

Philip F Carmichael, Bellevue, WA (US);

Brian Hayward, Seattle, WA (US);

Alvin G Solidum, Bellevue, WA (US);

Travis T Okahara, Kirkland, WA (US);

William L Richman, Seattle, WA (US);

Raman Chandrasekar, Seattle, WA (US);

Patrick Dean Kennedy, Fall City, WA (US);

Ray Sun, Bellevue, WA (US);

Assignee:

Tidyware, LLC, Bellevue, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2006.01); G06N 3/04 (2006.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06N 3/0445 (2013.01);
Abstract

Systems and methods for training a personalized Machine Learning (ML) model used to detect fall events are described herein. The methods may be implemented by one or more computing devices and may include obtaining sensor data associated with one or more activities of a user. A processed or unprocessed version of at least a copy of the sensor data having been fed to a personalized ML model associated with the user and that has been determined not to be associated with a fall event; and using the obtained sensor data training the personalized ML model.


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