The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2021
Filed:
Sep. 19, 2018
Applicant:
Casio Computer Co., Ltd., Tokyo, JP;
Inventor:
Masaaki Sasaki, Hachioji, JP;
Assignee:
CASIO COMPUTER CO., LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); A45D 29/14 (2006.01); G06T 7/136 (2017.01); G06T 7/73 (2017.01); G06T 7/181 (2017.01); G06T 7/13 (2017.01); A45D 29/00 (2006.01); G06T 7/62 (2017.01); G06T 7/174 (2017.01);
U.S. Cl.
CPC ...
G06K 9/4604 (2013.01); A45D 29/00 (2013.01); A45D 29/14 (2013.01); G06T 7/13 (2017.01); G06T 7/136 (2017.01); G06T 7/181 (2017.01); G06T 7/74 (2017.01); G06T 7/174 (2017.01); G06T 7/62 (2017.01);
Abstract
A nail contour detecting device including a processor, wherein the processor obtains first feature point data of a first nail contour which is a nail contour detected from a first nail image obtained by imaging a nail of a finger or a toe, and second feature point data of a second nail contour which is a nail contour detected from a second nail image obtained by imaging a nail of the same finger or toe as the first nail image; and the processor obtains one nail contour based on the first feature point data and the second feature point data.