The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2021

Filed:

Mar. 25, 2019
Applicant:

Nippon Steel Corporation, Tokyo, JP;

Inventor:

Junichi Nakagawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/23 (2020.01); G06F 30/17 (2020.01); G06F 113/26 (2020.01);
U.S. Cl.
CPC ...
G06F 30/23 (2020.01); G06F 30/17 (2020.01); G06F 2113/26 (2020.01);
Abstract

An analysis apparatus derives a second factor () according to a physical phenomenon with which an analysis target () is to comply. The analysis apparatus derives, based on the second factor (), a third factor () according to a physical phenomenon with which the analysis target () is to comply. The analysis apparatus decides, based on a result of evaluating the third factor (), a first factor () corresponding to the third factor. The second factor () indicates a state in the analysis target when the first factor () is given to the analysis target ().


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