The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2021

Filed:

Sep. 30, 2019
Applicant:

Splunk Inc., San Francisco, CA (US);

Inventors:

Peter Chen, Shanghai, CN;

Min Zhang, Chengdu, CN;

Feng Shao, Suzhou, CN;

Qianjie Zhong, Shanghai, CN;

Geng Qin, Shanghai, CN;

D. Randall Young, Kensington, CA (US);

Roy Zhang, Shenyang, CN;

Aaron Zhang, Shanghai, CN;

Assignee:

Splunk, Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/248 (2019.01); G06F 11/34 (2006.01); G06F 11/32 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3452 (2013.01); G06F 11/3006 (2013.01); G06F 11/323 (2013.01); G06F 11/3409 (2013.01); G06F 16/248 (2019.01); G06F 2201/835 (2013.01); G06F 2201/86 (2013.01);
Abstract

Techniques and mechanisms are disclosed that enable a data intake and query system to generate and cause display of circular timelines of timestamped event data. As used herein, a circular timeline generally refers to a graphical display of timestamped events stored by a data intake and query system, wherein the timestamped events may be displayed as arcs of one or more concentric circles and located in a circular timeline area according to a chronological ordering associated with the events. One or more display attributes of each arc may further depend on other data associated with the corresponding events. For example, each arc of a circular time may be displayed at a particular radial distance, with a particular thickness, using a particular shading and/or color, etc., depending on various data values associated with the one or more events represented by the arc.


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