The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2021

Filed:

Sep. 20, 2019
Applicant:

Honeywell International Inc., Morris Plains, NJ (US);

Inventors:

Graeme Laycock, Hunters Hill, AU;

Mark Bertinetti, East Killara, AU;

Rahul Nath, Redfern, AU;

Assignee:

Honeywell International Inc., Charlotte, NC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
G05B 19/41835 (2013.01); G05B 2219/31284 (2013.01); G05B 2219/37591 (2013.01);
Abstract

A computing system for receiving operational data including process parameters generated by sensors in a plant. An analysis engine uses the operational data to automatically provide a first listing of worst performing process parameters, that when a selected poor performing process parameter is chosen generates a ranked filtered view of equipment parameters for associated processing equipment that may be affected by the selected poor performing parameter and a filtered view of recommendations for recognizing action(s) to fix the associated processing equipment and/or the selected poor performing process parameter, and/or a second listing of worst performing processing equipment that when a selected poor performing processing equipment is chosen generates a ranked filtered view of suspected process parameters that may be affected by the selected poor performing processing equipment along with a filtered view of recommendations for recognizing action(s) to fix the selected poor performing processing equipment and the suspected process parameters.


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