The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2021
Filed:
Mar. 19, 2019
Tsinghua University, Beijing, CN;
TSINGHUA UNIVERSITY, Beijing, CN;
Abstract
Provided are a 3D microscopic imaging method and a 3D microscopic imaging system. The method includes: acquiring a first PSF of a 3D sample from an object plane to a plane of a main camera sensor and a second PSF of the 3D sample from the object plane to a plane of a secondary camera sensor, and generating a first forward projection matrix corresponding to the first PSF and a second forward projection matrix corresponding to the second PSF; acquiring a light field image captured by the main camera sensor and a high resolution image captured by the secondary camera sensor; generating a reconstruction result of the 3D sample by reconstructing the light field image, the first forward projection matrix, the high resolution image and the second forward projection matrix according to a preset algorithm.