The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2021

Filed:

Sep. 19, 2017
Applicant:

The University of New Hampshire, Durham, NH (US);

Inventors:

Mahdi H. Al-Badrawi, Durham, NH (US);

Nicholas J. Kirsch, Portsmouth, NH (US);

Bessam Z. Al-Jewad, Madbury, NH (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 23/20 (2006.01); G06F 17/14 (2006.01);
U.S. Cl.
CPC ...
G01R 23/20 (2013.01); G06F 17/14 (2013.01);
Abstract

An Empirical Mode Decomposition (EMD)-based noise estimation process is disclosed herein that allows for blind estimations of noise power for a given signal under test. The EMD-based noise estimation process is non-parametric and adaptive to a signal, which allows the EMD-based noise estimation process to operate without necessarily having a priori knowledge about the received signal. Existing approaches to spectrum sensing such as Energy Detector (ED) and Maximum Eigenvalue Detector (MED), for example, may be modified to utilize a EMD-based noise estimation process consistent with the present disclosure to shift the same from semi-blind category to fully-blind category.


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