The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2021
Filed:
Feb. 05, 2016
Hitachi High-technologies Corporation, Tokyo, JP;
Hideto Tamezane, Tokyo, JP;
Isao Yamazaki, Tokyo, JP;
Masaharu Nishida, Tokyo, JP;
Ryota Kamoshida, Tokyo, JP;
HITACHI HIGH-TECH CORPORATION, Tokyo, JP;
Abstract
An automatic analyzer which is capable of detecting a dispensing abnormality with a high degree of accuracy without causing the decrease in the determination performance or the increase in the calculation amount caused by the configuration balance of the reference database is implemented. A dispensing nozzle of a sample dispensing mechanismis immersed in a dispensing target contained in a specimen containerand sucks the dispensing target, and internal pressure of the dispensing nozzle of the sample dispensing mechanismof ejecting the sucked dispensing target to a reaction containeris detected through a pressure sensor. A plurality of feature quantities are extracted from a waveform of the detected pressure, and a determination result is output through a linear combination formula using an optimal coefficient for a determination function that receives a plurality of feature quantities and outputs one value. The determination result indicates whether or not dispensing of the sample dispensing mechanismis performed normally in accordance with the magnitude of the output result of the determination function.