The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2021
Filed:
Feb. 18, 2020
Applicant:
Pratt & Whitney Canada Corp., Longueuil, CA;
Inventors:
Mario Blais, Varennes, CA;
Clement Drouin Laberge, Terrebonne, CA;
Assignee:
PRATT & WHITNEY CANADA CORP., Longueuil, CA;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/00 (2013.01); G01N 2033/0078 (2013.01);
Abstract
Methods and systems for calibrating inspection of a feature on a part are described. The method comprises acquiring, at a plurality of point cloud densities, measurement data from a reference part having a known defect associated with the feature; assessing the measurement data at the plurality of point cloud densities to detect the known defect; determining a lowest point cloud density from the plurality of point cloud densities at which the known defect is detectable; and setting an inspection point cloud density for inspection of the feature to the lowest point cloud density.