The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2021
Filed:
Dec. 05, 2019
Hitachi-ge Nuclear Energy, Ltd., Ibaraki, JP;
Sou Kitazawa, Tokyo, JP;
Hidetaka Komuro, Hitachi, JP;
Junichiro Naganuma, Hitachi, JP;
Kazuya Ehara, Hitachi, JP;
HITACHI-GE NUCLEAR ENERGY, LTD., Hitachi, JP;
Abstract
An ultrasonic flaw detection method and device identifies echoes appearing in flaw detection images. By selecting and controlling combinations of transmitting elements and receiving elements, plural waveform signals c are recorded. For each position in an inspection object, intensities of plural waveform signals are extracted based on the propagation time of ultrasonic waves and are totalized. A flaw detection image showing distribution of totalized intensities is generated. By selectively using at least three sound velocities for calculating propagation time of ultrasonic waves, at least three flaw detection images are generated. The areas of at least three echoes respectively appearing in the flaw detection images are calculated and the echo area which is the smallest is identified according to whether or not the flaw detection image showing the echo is one generated using one of a longitudinal sound velocity, a transverse sound velocity and a medium sound velocity.