The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2021
Filed:
May. 25, 2018
Applicant:
Broadsens Corp., Milpitas, CA (US);
Inventors:
Chang Zhang, San Jose, CA (US);
Lei Liu, San Ramon, CA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/04 (2006.01); G01N 29/40 (2006.01); G01N 29/44 (2006.01); G01N 29/24 (2006.01);
U.S. Cl.
CPC ...
G01N 29/04 (2013.01); G01N 29/043 (2013.01); G01N 29/2475 (2013.01); G01N 29/40 (2013.01); G01N 29/4427 (2013.01); G01N 2291/0289 (2013.01);
Abstract
The present invention discloses a method for extending the detection range of a structural health monitoring (SHM) system. A structure being monitored is scanned multiple times. A scan with no collection delay covers an original detection area of the SHM system. Scans with collection delays cover extended detection areas. The SHM system's detection range is extended when results of multiple scans with different collection delays are combined.