The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2021
Filed:
Dec. 23, 2019
New York University, New York, NY (US);
Daniel K. Sodickson, Larchmont, NY (US);
Martijn Anton Hendrik Cloos, Long Island City, NY (US);
New York University, New York, NY (US);
Abstract
An apparatus for non-destructive testing of a sample includes a sample holder configured to contain or support the sample; an exciter configured to generate an oscillating electromagnetic field across the sample that operates with at least one predetermined excitation frequency; a receiver configured to detect harmonic electromagnetic signals resulting from induced electromagnetic fields oscillating with at least one frequency that is not equal to the at least one predetermined excitation frequency; a recorder configured to record the harmonic electromagnetic signals; and a processor programmed to construct an induced harmonic electromagnetic spectrum based on the harmonic electromagnetic signals.