The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2021

Filed:

May. 29, 2017
Applicant:

Bobst Mex SA, Mex, CH;

Inventors:

Matthieu Richard, Remoray, FR;

Francis Pilloud, Clarens, CH;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/89 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8901 (2013.01); G01N 21/8806 (2013.01); G01N 2021/8822 (2013.01); G01N 2021/8905 (2013.01);
Abstract

A surface inspection system for inspecting the surface of sheet elements present in an inspection area: The system includes two light sources arranged adjacent each other on opposite sides of an illumination plane, and a camera for capturing line images of the inspection area along a viewing plane. The illumination plane and the viewing plane are arranged on opposite sides of a median plane perpendicular to an inspection plane. The angle between the illumination plane and the median plane is the same as the angle between the viewing plane and the median plane. In a method of using the system, the first light source illuminates the sheet element before the second light sources does. An image evaluation unit compares the captured line images with each other.


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