The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2021
Filed:
Mar. 04, 2019
Fujifilm Corporation, Tokyo, JP;
Kenta Matsubara, Ashigarakami-gun, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Provided are a captured image evaluation apparatus, a captured image evaluation method, and a captured image evaluation program capable of evaluating a thickness and a density of stacked cultured cells in a short imaging time. The captured image evaluation apparatus includes: an image acquisition sectionthat acquires captured images obtained by imaging a subject under a condition in which a numerical aperture of an objective lens is changed; a thickness estimation sectionthat estimates a thickness of the subject on the basis of a low NA captured image obtained under a condition in which the numerical aperture of the objective lens is relatively small; and a density estimation sectionthat estimates a density of the subject on the basis of a high NA captured image obtained under a condition in which the numerical aperture of the objective lens is relatively large.