The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2021
Filed:
Oct. 04, 2017
National University Corporation Nagoya University, Aichi, JP;
Osaka University, Osaka, JP;
Kyushu University, National University Corporation, Fukuoka, JP;
Hirotoshi Yasaki, Nagoya, JP;
Takao Yasui, Nagoya, JP;
Noritada Kaji, Nagoya, JP;
Yoshinobu Baba, Nagoya, JP;
Tomoji Kawai, Osaka, JP;
Satoyuki Kawano, Osaka, JP;
Kentaro Doi, Osaka, JP;
Takeshi Yanagida, Fukuoka, JP;
Mao Fukuyama, Sendai, JP;
NATIONAL UNIVERSITY CORPORATION NAGOYA UNIVERSITY, Aichi, JP;
OSAKA UNIVERSITY, Osaka, JP;
KYUSHU UNIVERSITY, NATIONAL UNIVERSITY CORPORATION, Fukuoka, JP;
Abstract
In a method for analyzing samples involving the use of a device for analyzing samples, the device for analyzing samples includes at least a movement part through which a sample moves, and a measurement unit that is formed in a middle of the movement part and that measures a value of an ion current when the sample passes through the movement part. The analysis method includes at least a measurement step for measuring the value of the ion current when the sample passes through the movement part, and a determination step for determining a change over time in a quantity of ions from the value of the ion current measured in the measurement step. The quantity of ions includes a quantity of ions that have leaked from the sample during movement of the sample through the movement part.