The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2021

Filed:

Mar. 30, 2017
Applicant:

Lg Chem, Ltd., Seoul, KR;

Inventors:

Sung Hyun Park, Daejeon, KR;

Chae Gyu Lee, Daejeon, KR;

Ye Hoon Im, Daejeon, KR;

Yu Taek Sung, Daejeon, KR;

Myung Han Lee, Daejeon, KR;

Oh Joo Kwon, Daejeon, KR;

Heon Yong Kwon, Daejeon, KR;

Dae Sik Hong, Daejeon, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 11/00 (2006.01); G16C 20/00 (2019.01); G16C 60/00 (2019.01); G01N 33/44 (2006.01); G01N 24/08 (2006.01);
U.S. Cl.
CPC ...
G01N 11/00 (2013.01); G01N 33/442 (2013.01); G16C 20/00 (2019.02); G16C 60/00 (2019.02); G01N 24/08 (2013.01); G01N 2011/004 (2013.01);
Abstract

The present application relates to a method for quantitative analysis of a polymer structure. Specifically, the method may be carried out through steps of measuring rheological properties and/or molecular weight distribution of the arbitrarily selected polymer, setting a random value for the selected polymer and then predicting the rheological property and/or the molecular weight distribution of the polymer from the random value, and comparing the measured value with the predicted value to determine the value of the structural parameter of the polymer.


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