The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2021
Filed:
Feb. 27, 2018
Yuasa System Co., Ltd., Okayama, JP;
Yuasa System Co. Ltd., Okayama, JP;
Abstract
Provided is a deformation tester where a specimen is deformed and can be observed and analyzed in any deformation state without removal. The tester includes: a detachable part repeating a relative displacement cycle, two portions of the specimen attached to a first and a second attachment portion of a first and a second part member, the specimen deformed from a first to a second shape state and back to the first shape state during the cycle; and a main body part that the detachable part is detachably attached to; wherein a state retaining part for fixing a relative position of the second to the first part member in at least one shape state is freely attachable to the detachable part mounted on the main body part and the detachable part with the state retaining part is freely attachable to the main body part.