The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2021
Filed:
Nov. 30, 2019
Munro Design & Technologies, Llc, Ontario, NY (US);
James F. Munro, Ontario, NY (US);
MUNRO DESIGN & TECHNOLOGIES, LLC, Ontario, NY (US);
Abstract
An interferometer system includes a measurement arm comprising a measurement dispersive optical system, a reference arm comprising a bulk diffuser object and a reference dispersive optical system, and an output system. The measurement dispersive optical system is positioned to direct measurement chromatic light towards a target, receive diverging chromatic measurement light from the target, and direct detected measurement light from the received diverging chromatic measurement light towards the output system. The reference dispersive optical system is positioned to direct reference chromatic light towards the bulk diffuser object, receive diverging chromatic reference light from the bulk diffuser object, and direct detected reference light from the received diverging chromatic reference light towards the output system. The output system is configured to determine at least one measured property of the target from the detected measurement light and the detected reference light.