The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2021
Filed:
Jan. 23, 2018
Faz Technology Ltd., Dublin, IE;
John O'Dowd, Dublin, IE;
Devrez Mehmet Karabacak, Dublin, IE;
Roger Maher, Dublin, IE;
Vivian Bessler, Dublin, IE;
Lymperis Voudouris, Dublin, IE;
OPTICS11 FAZ LIMITED, Dublin, IE;
Abstract
The present invention provides a method for measuring an optical sensor system comprising an array of intrinsic fiber optic sensors at an interrogator comprising an optical source and an optical detector. The method comprises the steps of emitting an optical signal to an array of intrinsic fiber optic sensors; detecting optical responses to the emitted signal from the sensors; associating each detected optical response with an individual sensor by determining within which region among a plurality of detection regions assigned to the individual sensors the optical response is detected wherein each detection region corresponds to a wavelength range in the bandwidth of the optical sensor system; and performing signal processing on each optical response to measure the value of the physical parameter detected by its associated sensor. A calibration of the detection region assigned to each sensor is performed at predetermined intervals.