The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2021

Filed:

Apr. 25, 2019
Applicant:

City University of Hong Kong, Kowloon, HK;

Inventors:

Jian Lu, Kowloon, HK;

Yu Bu, Kowloon, HK;

Ge Wu, Kowloon, HK;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 28/00 (2006.01); G02B 5/28 (2006.01); C23C 14/35 (2006.01); G02B 1/00 (2006.01); G02B 1/14 (2015.01); B82Y 40/00 (2011.01);
U.S. Cl.
CPC ...
C23C 28/345 (2013.01); C23C 14/35 (2013.01); C23C 28/323 (2013.01); G02B 1/00 (2013.01); G02B 1/002 (2013.01); G02B 1/14 (2015.01); G02B 5/28 (2013.01); B32B 2307/416 (2013.01); B82Y 40/00 (2013.01); G02B 1/005 (2013.01); G02B 5/286 (2013.01);
Abstract

A system and a method for a nanostructured film including a first layer for reflecting at least a portion of an electromagnetic radiation and a second layer for receiving the remainder of the electromagnetic radiation through the first layer and subsequently reflecting at least a portion of the received electromagnetic radiation through the first layer, wherein two electromagnetic radiations with the same wavelength reflected by the first and second layers respectively are combined to form a strengthened electromagnetic radiation, the wavelength of the strengthened electromagnetic radiation being variable based on the physical property of the first layer.


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