The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2021
Filed:
Sep. 07, 2018
Trumpf Laser- Und Systemtechnik Gmbh, Ditzingen, DE;
Tobias Hagenlocher, Ditzingen, DE;
Thomas Kieweler, Wimsheim, DE;
TRUMPF Laser- und Systemtechnik GmbH, Ditzingen, DE;
Abstract
In a method for determining a deviation of a spatial orientation of a beam axis (S) of a beam processing machine from a spatial nominal orientation (S) of the beam axis (S), contour sections (KA, KB) are cut with a processing beam into a test workpiece from two sides of the workpiece. The contour sections (KA, KB) extend parallel to a nominal orientation of a rotation axis (B, C), where the rotation axis is to be calibrated. The contour sections (KA, KA) are probed from one side of the test workpiece by a measuring device for determining the spatial position of the contour sections (KA, KB). Deviation of the spatial orientation of the beam axis (S) of the beam processing machine from the spatial nominal orientation (S) is determined based on the spatial positions of the contour sections (KA, KB).