The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2021

Filed:

Mar. 19, 2020
Applicant:

Accuray, Inc., Sunnyvale, CA (US);

Inventors:

Chuanyong Bai, Solon, OH (US);

Zhicong Yu, Highland Hts., OH (US);

Amit Jain, Solon, OH (US);

Daniel Gagnon, Twinsburg, OH (US);

Assignee:

Accuray, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G01N 23/201 (2018.01); A61N 5/10 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5282 (2013.01); A61B 6/032 (2013.01); A61B 6/4085 (2013.01); A61B 6/4291 (2013.01); A61B 6/466 (2013.01); A61N 5/1031 (2013.01); A61N 5/1081 (2013.01);
Abstract

An imaging apparatus and associated methods are provided to receive measured projection data in a primary region and correct for scatter by processing the imaging data as two separate components: non-scatter-corrected data and scatter-only data. Separate image processing (e.g., reconstruction) allows for the use of individualized data processing, including filters, suited to the source data, thereby focusing on specific aspects of the source data, including, for example, noise and artifact reduction, resolution, edge preservation, etc. Combining the separately processed data results in an optimized balance of these aspects with improved image quality.


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