The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2021
Filed:
Nov. 08, 2018
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Koichi Tanabe, Kyoto, JP;
Yukihisa Wada, Kyoto, JP;
Satoshi Tokuda, Kyoto, JP;
Satoshi Sano, Kyoto, JP;
Akira Horiba, Kyoto, JP;
Assignee:
Shimadzu Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/10 (2006.01);
U.S. Cl.
CPC ...
A61B 6/484 (2013.01); A61B 6/107 (2013.01); A61B 6/4035 (2013.01); A61B 6/5211 (2013.01); A61B 6/5282 (2013.01);
Abstract
In an X-ray imaging apparatus an image processor is configured to generate a phase contrast image based on a plurality of first images acquired by a first detection region (R) at a plurality of relative positions of the first detection region with respect to a subject (T) to be imaged, and to generate an absorption image based on a plurality of second images acquired by a second detection region (R) at a plurality of relative positions of the second detection region with respect to the subject.