The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2021

Filed:

Jan. 20, 2018
Applicant:

Cylite Pty Ltd, Notting Hill, AU;

Inventors:

Steven James Frisken, Vaucluse, AU;

Grant Andrew Frisken, Mitcham, AU;

Assignee:

Cylite Pty Ltd, Notting Hill, AU;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/33 (2017.01); A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); G06T 7/33 (2017.01); G06T 2207/10101 (2013.01);
Abstract

Methods and apparatus are provided for optical coherence metrology or tomography across an extended area of an eye with improved registration. At least two optical coherence tomograms are acquired, with each tomogram containing data from regions of an anterior surface of the eye that are at least partially overlapping, and data from one or more deeper structures such as the retina or the anterior or posterior lens surfaces. The tomograms are then processed to register the data from the overlapping portions of the anterior surface regions, thereby registering the data from the deeper structures. In certain embodiments the reference arm of the apparatus comprises a compound reflector having at least two axially separated reflective surfaces for applying differential delays to different portions of the reference beam. The depth of field of the apparatus is thereby extended to enable measurement of eye length. In certain embodiments eye length measurements at a number of angles of incidence provide information on total eye shape.


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