The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 2021
Filed:
Dec. 19, 2018
Fujitsu Limited, Kawasaki, JP;
Reiko Kondo, Yamato, JP;
Yukihiro Watanabe, Kawasaki, JP;
Masahiro Asaoka, Kawasaki, JP;
Tetsuya Uchiumi, Kawasaki, JP;
Kazuhiro Suzuki, Kawasaki, JP;
Fumi Iikura, Shinagawa, JP;
Shingo Okuno, Kawasaki, JP;
Yuji Saito, Yokohama, JP;
FUJITSU LIMITED, Kawasaki, JP;
Abstract
An apparatus obtains, from a first device, an identifier of a higher-order service for which occurrence of an abnormality or a possibility of being affected by an abnormality has been detected, where the first device searches for a range of effects of failure within a higher-order service layer that provides a higher-order service using a service provided in an object-service layer within a cloud service providing a layered structure of services. The apparatus determines a service within the object-service layer, which is reachable by tracing relations among services from the detected higher-order service, to be an in-effect-range service for which there is a possibility of being affected by an abnormality, and transmits the identifier of the in-effect-range service to a second device that searches for a range of effects of failure at a lower-order service layer that provides a lower-order service used to provide a service within the object-service layer.