The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 2021
Filed:
Jan. 07, 2020
Applicant:
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Inventors:
Assignee:
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/10 (2015.01); G01R 29/10 (2006.01);
U.S. Cl.
CPC ...
H04B 17/104 (2015.01); G01R 29/105 (2013.01);
Abstract
A method for performing a radiated two-stage method measurement on a device under test having a predefined number of antennas, comprising: placing the device under test on a positioner; establishing communication with the device under test using at least one link antenna; and measuring the antenna pattern of the device under test using a plurality of measurement antennas, wherein the plurality of measurement antennas comprise a number of measurement antennas being larger than the number of antennas of the device under test. Further, a measurement setup is shown.