The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2021

Filed:

Nov. 20, 2019
Applicant:

Nanya Technology Corporation, New Taipei, TW;

Inventor:

Teng-Yen Huang, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 23/00 (2006.01); H01L 21/66 (2006.01); H01L 21/768 (2006.01);
U.S. Cl.
CPC ...
H01L 23/562 (2013.01); H01L 21/76877 (2013.01); H01L 22/12 (2013.01); H01L 22/34 (2013.01);
Abstract

The present application discloses a semiconductor device and a method for fabricating the semiconductor device. The semiconductor device includes a substrate; a first crack-detecting structure positioned in the substrate and including a first insulating stack inwardly positioned in the substrate, a first bottom conductive layer positioned on the first insulating stack, and a first filler layer positioned on the first bottom conductive layer; and a second crack-detecting structure positioned adjacent to the first crack-detecting structure and including a second insulating stack inwardly positioned in the substrate, a second bottom conductive layer positioned on the second insulating stack, and a second filler layer positioned on the second bottom conductive layer.


Find Patent Forward Citations

Huang, Teng-Yen. (2021). Semiconductor device with crack-detecting structure and method for fabricating the same (U.S. Patent No. 11164823). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11164823

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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