The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2021

Filed:

Jul. 02, 2020
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventor:

Akira Fujita, Koshi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/67 (2006.01); H01L 21/687 (2006.01); H01L 21/311 (2006.01);
U.S. Cl.
CPC ...
H01L 21/6708 (2013.01); H01L 21/31111 (2013.01); H01L 21/68764 (2013.01);
Abstract

An etching apparatus includes a substrate holder configured to hold a substrate; a rotation driver configured to rotate the substrate holder around a rotation axis; a liquid discharge unit configured to discharge an etching solution to a peripheral portion of the substrate; and a controller configured to control an operation of the etching apparatus by controlling at least the rotation driver and the liquid discharge unit. The controller controls at least one of a rotational velocity of the substrate, a discharge velocity of the etching solution from the liquid discharge unit or a discharge direction of the etching solution from the liquid discharge unit to etch the substrate under immediate deviation conditions in which the etching solution is deviated from the substrate immediately after the etching solution from the liquid discharge unit lands at a liquid landing point in the peripheral portion of the substrate.


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