The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 2021
Filed:
Jun. 15, 2018
Shimadzu Research Laboratory(shanghai) Co., Ltd., Shanghai, CN;
Kent James Gillig, Shanghai, CN;
Keke Wang, Shanghai, CN;
Wenjian Sun, Shanghai, CN;
Xiaoqiang Zhang, Shanghai, CN;
Yupeng Cheng, Shanghai, CN;
SHIMADZU RESEARCH LABORATORY (SHANGHAI) CO., LTD., Shanghai, CN;
Abstract
The invention provides an ion mobility analyzer apparatus and analysis method. The analyzer apparatus includes an ion source, two groups of parallel electrodes, a power supply unit and a detector. The drift region is formed between the two groups of parallel electrodes, and has an ion entrance connected to the ion source and an ion exit. Each group of parallel electrodes is located in a plane respectively, and the two planes are parallel to each other. The power supply unit is configured to apply direct current potentials on the two groups of parallel electrodes to form a direct current electric field that applies an opposing force on ions against the gas flow so that ions with different mobilities are trapped under the combined effect of the gas flow and the direct current electric field. The detector is connected to the ion exit to detect ions.