The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2021

Filed:

Oct. 28, 2019
Applicant:

Samsung Display Co., Ltd., Yongin-si, KR;

Inventor:

Jong-Hoon Yeum, Yongin-si, KR;

Assignee:

SAMSUNG DISPLAY CO., LTD., Yongin-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/372 (2011.01); G06T 7/62 (2017.01); G06T 7/50 (2017.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 7/50 (2017.01); G06T 7/62 (2017.01); H04N 5/372 (2013.01);
Abstract

A device for inspecting a display device includes a camera to photograph a substrate and generate image information, a pixel value setter to set pixel values corresponding to respective luminances of a plurality of pixels from the image information, and to detect a crack region based on the pixel values, a stress calculator to calculate a critical stress of a crack included in the crack region, and a determiner to check whether the critical stress is equal to or greater than a first threshold value and to determine whether the substrate has defects. The stress calculator calculates a critical stress of the substrate by using fracture toughness, a shape factor, and a crack depth. The shape factor is set to increase as a compressive stress of the substrate increases.


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