The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2021

Filed:

Aug. 22, 2019
Applicant:

Walmart Apollo, Llc, Bentonville, AR (US);

Inventors:

Mani Kanteswara Garlapati, Bangalore, IN;

Souradip Chakraborty, Bengaluru, IN;

Rajesh Shreedhar Bhat, Kumta, IN;

Assignee:

Walmart Apollo, LLC, Bentonville, AR (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06T 7/00 (2017.01); G06T 5/00 (2006.01); G06Q 30/06 (2012.01); G06T 7/70 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06K 9/6215 (2013.01); G06K 9/6255 (2013.01); G06Q 30/0603 (2013.01); G06T 5/002 (2013.01); G06T 7/70 (2017.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30168 (2013.01);
Abstract

Systems, methods, and computer-readable storage media for cataloguing and assessing images. This is performed by a system which receives images of an item, and identifying, within each image, the item. The system performs a structural similarity analysis of the item and for each image applies a plurality of distortions, such that for each image in the images multiple distorted images are generated. The system identifies within the distorted images at least one feature and applies a regression model to the images using the at least one feature and the structural similarity score.


Find Patent Forward Citations

Loading…