The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2021

Filed:

Aug. 23, 2019
Applicant:

Michael Edwin Stewart, Menlo Park, CA (US);

Inventor:

Michael Edwin Stewart, Menlo Park, CA (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06T 5/20 (2006.01); G06N 20/00 (2019.01); G06T 5/50 (2006.01); G06T 5/10 (2006.01);
U.S. Cl.
CPC ...
G06T 5/009 (2013.01); G06N 20/00 (2019.01); G06T 5/002 (2013.01); G06T 5/10 (2013.01); G06T 5/20 (2013.01); G06T 5/50 (2013.01);
Abstract

Methods and apparatus for enhancing optical images and parametric databases are disclosed. In an exemplary embodiment, a method includes identifying a parametric database having one or more dimensions of varying parameter values, and enhancing the parametric database utilizing a pyramid data structure that includes a plurality of pyramid levels as an input to and output from the frequency blender. Each of the plurality of levels of the pyramid data structure includes an instance of the parametric database having a unique parameter sampling resolution, a frequency isolation representation at that resolution, and a frequency blended representation of the parametric database at that resolution. The method also includes utilizing a frequency blender and auto throttle to perform the blending of a plurality of levels, and returning the enhanced parametric database.


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