The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 2021
Filed:
Oct. 08, 2019
Chung Ang University Industry Academic Cooperation Foundation, Seoul, KR;
Abstract
Provided are a system and method for correcting an image through estimation of a distortion parameter. The method includes receiving a distorted image including one or more measurement targets, extracting a plurality of feature points from each of the measurement targets, classifying the one or more measurement targets as a distorted target and an undistorted target by comparing distances between the plurality of extracted feature points and a center point of the received distorted image with each other, estimating a distortion parameter on the basis of standard deviations of a plurality of feature points of the classified distorted target and undistorted target, and correcting the received distorted image on the basis of the estimated distortion parameter.