The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 2021
Filed:
Apr. 20, 2018
International Business Machines Corporation, Armonk, NY (US);
Nirmit V. Desai, Yorktown Heights, NY (US);
Kelvin Kakugawa, San Francisco, CA (US);
Carmelo I. Uria, Boise, ID (US);
Wendy Chong, Yorktown Heights, NY (US);
Steven E. Millman, Spring Valley, NY (US);
Shahrokh Daijavad, Morgan Hill, CA (US);
Heather D. Achilles, Gilmanton, NH (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A trained base model is distributed to a set of nodes. From a first node in the set of nodes, a first set of meta-metrics resulting from a transfer learning operation on the trained base model at the first node is collected. The transfer learning at the first node uses first local data available at the first node. The first node is clustered in a cluster with a second node from the set of nodes, in response to a meta-metric in the first set of meta-metrics being within a tolerance value of a corresponding meta-metric in a second set of meta-metrics collected from the second node. A normalized set of model parameters is constructed after an iteration of transfer learning or local learning at the first and second nodes. The normalized set of model parameters is distributed to the first node and the second node in the cluster.