The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2021

Filed:

Jun. 14, 2019
Applicant:

Bank of America Corporation, Charlotte, NC (US);

Inventors:

Brandon Sloane, Santa Barbara, CA (US);

Brian Diederich, Simi Valley, CA (US);

Assignee:

BANK OF AMERICA CORPORATION, Charlotte, NC (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01); G06F 8/65 (2018.01); G06N 3/04 (2006.01); G06F 16/901 (2019.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 8/65 (2013.01); G06F 16/9024 (2019.01); G06N 3/04 (2013.01); G06N 3/08 (2013.01); G06F 2221/033 (2013.01);
Abstract

A system provides analysis of computer application vulnerabilities via multidimensional correlation and prioritization. The system may begin by generating a data repository of each application within a computing environment. Once the data repository is generated, the system may assess the dependencies, relationships, and vulnerabilities of the applications and processes used within the system. The system may perform assessments across multiple dimensions and/or metrics (e.g., impacts on users, devices, networks, applications, and/or data). Based on performing said assessments, the system may calculate relatedness and/or dependency scores across the dimensions or metrics, where the scores may be used to generate a prioritization scheme for making changes to application code or applying updates.


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