The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 2021
Filed:
Sep. 28, 2020
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Alexandre Campos Perez, San Mateo, CA (US);
Eric A. Bier, Palo Alto, CA (US);
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Abstract
One embodiment provides a system and method for automatically localizing faults in a software system. During operation, the system executes a number of tests associated with the software system to output a spectrum indicating test-coverage patterns of components within the software system; and identifies, based on the spectrum, an ambiguity group associated with at least one failed test. The ambiguity group includes multiple components having a same coverage pattern. The system instruments the multiple components. Instrumenting a respective component includes inserting instructions for monitoring runtime values of at least one variable. The system identifies a subset of tests within which the instrumented multiple components are active, re-executes the identified subset of tests with the multiple components being instrumented, and identifies one component from the multiple components as being likely to cause the at least one failed test based on results of the re-executed subset of tests.