The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 2021
Filed:
Sep. 23, 2019
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Hirokuni Kitahara, Tokyo, JP;
Yuji Watanabe, Tokyo, JP;
Pablo Salvador Loyola Heufemann, Tokyo, JP;
Kugamoorthy Gajananan, Tokyo, JP;
Assignee:
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 9/54 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0793 (2013.01); G06F 9/542 (2013.01); G06F 11/076 (2013.01); G06F 11/3072 (2013.01);
Abstract
Methods and systems for detecting mutation events include collecting change event pattern counts from one or more processing nodes. Unintended change events are identified based on the collected change event pattern counts. A corrective action is performed for the unintended change events.